Water tree in polymeric cables: a review
DOI:
https://doi.org/10.11113/mjfas.v11n4.402Keywords:
Water treeing detection, water treeing mechanism, underground polymeric cable, XLPE cable, modifed leaf-like method, vented tree, bow-tie tree,Abstract
The power cable breakdown suspected due to water treeing in polymeric cables are said to be the main cause. The inconsistent and unreliable nature brings out the importance of research in water treeing detection in polymeric cables. Early detection of water tree in polymeric cables is important in order to increase the cable efficiency by reducing the timeframe of the cable failure. This paper presents a comprehensive review of water treeing detections in polymeric cables, in particular, the relation to the background of water treeing, the types of water treeing, experimental investigations on water treeing, and factors affecting the initiation and growth of water trees.
References
K. Uchida, Y. Kato, M. Nakade, D. Inoue, H. Sakakibara, H. Tanaka, Furukawa Review, 20, 65 (2000).
I. Radu, M. Acedo, P. Notingher, F. Frutos, J. C. Filippini, IEEE Annual Report of the Conf. on Electr. Insul. and Dielec. Phenom., 1996, p. 762.
T. Zhou , X. Zeng, Intern. Conf. on Comp. Distrib. Contr. and Intell. Environ. Monit. (CDCIEM), 2012, p. 158.
H. M. Li, R. A. Fouracre, B. H. Crichton, IEEE Trans. on Dielec. and Electr. Insul., 2, 866 (1995).
M. H. Abderrazzaq, IEEE Trans. on Dielec. and Electr. Insul., 12, 158 (2005).
J. P. Crine, IEEE Trans. on Dielec. and Electr. Insul., 5, 681 (1998).
L. Huimin, B. H. Crichton, R. A. Fouracre, J. of Phys. D : Appl. Scie, 24, 1436 (1991).
Z. Al-Hamouz, K. Soufi, M. Ahmed, M. A. Al-Ohali, M. Garwan, 8th Annual IEEE Tech. Exch. Meeting, 2001, p. 1.
R. Patsch, J. Jung, IEEE Intern. Symp. on Electr. Insul., 2000, p. 133.
A. G. Gonzalez, I. Paprotny, R. M. White, P. K. Wright, Electr. Insul. Conf. (EIC), 2011, p. 345.
R. Papazyan, R. Eriksson, H. Edin, H. Flodqvist, 18th Intern. Conf. and Exhib. on Electr. Distrib. (CIRED), 2005, p. 1.
C. Kim, Z. Jin, X. Huang, P. Jiang, Q. Ke, Polym.Degrad. and Stabil., 92, 537 (2007).
R. Ross, Intern. Symp. on Electr. Insul. Mater., 1998, p. 535.
A. El-Zein, IEEE Intern. Symp. on Electr. Insul., 1998, p. 113.
R. Ross, IEEE Trans. on Dielec. and Electr. Insul., 5, 660 (1998).
J. P. Crine, J. Jow, IEEE Trans. on Dielec. and Electr. Insul., 8, 1082 (2001).
T. Miyashita, Intern. Symp. on Electr. Insul. Mater., 1998, p. 17.
J. P. Crine, IEEE Electr. Insul. Mag., 16, 13 (2000).
S. Hvidsten, E. Ildstad, J. Sletbak, H. Faremo, IEEE Trans. on Dielec. and Electr. Insul., 5, 754 (1998).
C. Smith, Partial Discharge and Insulation Failure,
IPEC Ltd.(2005).
S. Katakai, Asia Pacific Transmiss. and Distrib. Conf. and Exhib., 2002, p. 1411.
C. Mayoux, IEEE Trans. on Dielec. and Electr. Insul., 4, 665 (1997).
B.-y. Li, IEEE Intern. Symp. on Electr. Insul., 1996, p. 331.
R. Patsch, J. Jochen, Intern. Symp. on Electr. Insul. Mater., 1998, p. 469.
A. T. Bulinski, J. P. Crine, B. Noirhomme, R. J. Densley, S. Bamji, IEEE Trans. on Dielec. and Electr. Insul., 5, 558 (1998).
O. I. Visata, G. Teissedre, J. C. Filippini, P. V. Notingher, IEEE 7th Intern. Conf. on Sol. Dielectr., 2001, p. 373.
M. Acedo, F. Frutos, I. Radu, J. C. Filippini, IEEE Trans. on Dielec. and Electr. Insul., 13, 1225 (2006).
B. Hennuy, Q. De Clerck, A. Francois, D. Tenret, P. Leemans, J. Marginet, 8th Intern. Conf. on Insul. Power Cable, Jicable 2011.
E. Moreau, A. Boudet, C. Mayoux, C. Laurent, P. Montagne, J. Berdala, 3rd Intern. Conf. on Propert. and Appl. of Dielectr. Mater., 1991, p. 232.
I. E. Commission, IEC 61956, 2001.
M. H. Kim, N. Hozumi, Y. Murakami, M. Nagao, T. Kurihara, T. Okamoto, T. Tsuji, K. Uchida, Intern. Conf. on Cond. Monit. and Diagn., 2012, p. 141.
D. Hong-Zhi, X. Xiu-San, J.Phys. D: Appl. Phys., 29, 2682 (1996).
S. Jaruman, Effects of Artificial Acid Rain on Water Tree in Crosslinked Polyethylene Insulation Material, Master Thesis, Universiti Teknologi Malaysia, Johor Bahru (2009).
S. Boggs, J. Densley, J. Kuang, Conf. on, Electr. Insul. and Dielectr. Phenom., 1996, p. 311.
R. Ross, M. Megens, 6th Intern. Conf. on Proper. and Appl. of Dielectr. Mater., 2000, p. 455.
R. Ross, J. J. Smit, IEEE Trans. on Electr. Insul., 27, 519 (1992).
G. Teissedre, O. I. Visata, J. C. Filippini, Conf. on, Electr. Insul. and Dielectr. Phenom., 2002, p. 942.
F. Ciuprina, G. Teissedre, J. C. Filippini, P. V. Notingher, Conf. on, Electr. Insul. and Dielectr. Phenom., 2001, p. 245.
J. Jow, Conf. on, Electr. Insul. and Dielectr. Phenom., 1998, p. 669.
B. R. Varlow, D. W. Auckland, IEE Coll. on Mechan. Influ. on Electr. Insul. Perform., 1995, p. 8/1.
J. P. Crine, J. L. Parpal, C. Dang, IEE Proc. of Sci., Measur. and Technol., 143, 395 (1996).
M. Ahmed, M. A. Al-Ohali, M. A. Garwan, K. Al-Soufi, S. Narasimhan, IEEE Trans. on Dielec. and Electr. Insul., 6, 95 (1999).
R. H. Olley, A. S. Vaughan, D. C. Bassett, S. M. Moody, V. A. A. Banks, 1995 IEEE 5th Intern. Conf. on Conduc. and Breakd. in Sol. Dielectr., 1995, p. 676.
S. Hvidsten and E. Ildstad, IEEE Intern. Symp. on Electr. Insul., 1998, p. 101.
M. Carmo Lanca, L. A. Dissado, 7th International Conf. on Dielectr. Mater., Measurements and Applications, (Conf. Publ. No. 430), 1996, pp. 214-219.
L. Junhua, T. Jung, S. Baolong, Electr. Insul. Conf. and Electr. Manufac., 2003, p. 177.
M. C. Lanca, J. N. Marat-Mendes, L. A. Dissado, IEEE Trans. on Dielec. and Electr. Insul., 8, 838 (2001).
L. June-Ho, C. Sung-Min, S. Il-Keun, Conf. on, Electr. Insul. and Dielectr. Phenom., 1998, p. 657.
I. Radu, M. Acedo, J. C. Filippini, P. Notingher, F. Ftutos, IEEE Trans. on Dielec. and Electr. Insul., 7, 860 (2000).
P. V. Notingher, I. Radu, J. C. Filippini, IEEE 5th Intern. Conf. On Conduc. and Breakd. in Sol. Dielectr., 1995., p. 666.
M. Ihsan, Degradation of Polymeric Power Cable Due To Water Tree Under DC Voltage, Undergrad. Thesis, Universiti Teknologi Malaysia (2010).
R. Karis, "Effects of Mineral on The Water Treeing In The Crosslinked Polyethylene Insulating Material", Master Thesis, Universiti Teknologi Malaysia, Johor Bahru (2009).
E. F. Steennis, F. H. Kreuger, IEEE Trans. on Dielec. and Electr. Insul., 25, 989 (1990).
S. Hvidsten, H. Faremo, R. Eriksson, M. Wei, IEEE Intern. Symp. on Electr. Insul., 2002, p. 112.
R. Patsch, J. Jung, IEE Proc. Sci., Measur. and Technol., 146, 253 (1999).
J. Jung, R. Patsch, IEE 8th Conf. on Dielectr. Mater., Measur. and Appl., 2000. p. 53.
A. T. Bulinski, E. So, S. S. Bamji, Conf. on Precis. Electromag. Measur., 2002, p. 10.
Y. Yagi, H. Tanaka, and H. Kimura, Conf. on Electr. Insul. and Dielectr. Phenom., 1998, p. 653.
S. Hvidsten, E. Ildstad, B. Holmgren, P. Werelius, IEEE Trans. on PWRD, 13, 40 (1998).
T. Takada, N. Hozumi, IEEE Power Eng. Soci. Wint. Meet., 2000, p. 1609.
Z. M. Dang, D. M. Tu, C. W. Nan, 7th Intern. Conf. on Proper. and Appl. of Dielectr. Mater., 2003, p. 654.
Y. Li, J. Kawai, Y. Ebinuma, Y. Fujiwara, Y. Ohki, Y. Tanaka, T. Takada, IEEE Trans. on Dielec. and Electr. Insul., 4, 52 (1997).
S. Mukai, Y. Ohki, Y. Li, T. Maeno, Conf. on Electr. Insul. and Dielectr. Phenom., 1998, p. 645.
M. Nagao, W. Akama, T. Yamamoto, M. Kosaki, Conf. on Electr. Insul. and Dielectr. Phenom., 1996, p. 153.
M. J. Given, M. Judd, S. J. MacGregor, J. Mackersie, R. A. Fouracre, Conf. on Electr. Insul. and Dielectr. Phenom., 1999, p. 118.
M. Abou Dakka, S. S. Bamji, A. T. Bulinski, Conf. on Electr. Insul. and Dielectr. Phenom., 2001, p. 123.
M. Abou-Dakka, S. S. Bamji, and A. T. Bulinski, Conf. on Electr. Insul. and Dielectr. Phenom., 2002, p. 895.
Z. Al-Hamouz, K. Al-Soufi, M. Ahmed, M. A. Al-Ohali, M. Garwan, IEEE/PES Transmis. and Distrib. Conf. and Exhib., 2002, p. 1088.
D. L. Dorris, M. O. Pace, T. V. Blaleck, I. Alexeff, IEEE Trans. on Dielec. and Electr. Insul., 3, 523 (1996).
E. David, N. Amyot, J. F. Drapeau, Conf. on Electr. Insul. and Dielectr. Phenom., 2003, p. 165.
N. Amyot, S. Pelissou, Conf. on Electr. Insul. and Dielectr. Phenom., 1996, p. 299.
X. Zheng, D. Tu, 6th Intern. Conf. on Proper. and Appl. of Dielectr. Mater., 2000, p. 517.
K. Uchida, M. Nakade, D. Inoue, H. Sakakibara, M. Yagi, IEEE/PES Transmis. and Distrib. Conf. and Exhib., 2002, p. 1879.
B. Alijagic-Jonuz, P. H. F. Morshuis, H. J. Van Breen, J. J. Smit, IEEE 7th Intern. Conf. on Sol. Dielectr., 2001, p. 504.
B. Jonuz, P. H. F. Morshuis, H. J. Van Breen, J. Pellis, J. J. Smit, Conf. on Electr. Insul. and Dielectr. Phenom., 2000, p. 355.
Y. Z. Arief, M. Shafanizam, Z. Adzis, M. Z. H. Makmud, IEEE Intern. Conf. on Pwr and Ener., art. no. 6450355, 2012, p. 950.
B. Oyegoke, P. Hyvonen, M. Aro, N. Gao, IEEE Trans. on Dielec. and Electr. Insul., 10, 862 (2003).
P. Werelius, P. Tharning, R. Eriksson, B. Holmgren, U. Gafvert, IEEE Trans. on Dielec. and Electr. Insul., 8, 27 (2001).
M. Kuschel, B. Kryszak, W. Kalkner, IEEE 6th Intern. Conf. on Conduc. and Breakd. in Sol. Dielectr., 1998, p. 85.
E. Ildstad, H. Faremo, Conf. on Electr. Insul. and Dielectr. Phenom., 1999, p. 122.
R. Papazyan, R. Eriksson, 7th Intern. Conf. on,Propert. and Appl. of Dielectr. Mater., 2003, p. 187.
J. C. Filippini, C. T. Meyer, IEEE Trans. on Electr. Insul., 23, 275 (1988).
J. L. Chen, J. C. Filippini, IEEE Trans. on Electr. Insul., 28, 271 (1993).
Z. H. Fan, N. Yoshimura, IEEE Trans. on Dielec. and Electr. Insul., 3, 849 (1996).
A. Bulinski, R. J. Densley, IEEE Trans. on Electr. Insul., 16, 319 (1981).
V. Raharimalala, Y. Poggi, J. C. Filippini, IEEE Trans. on Dielec. and Electr. Insul., 1, 1094 (1994).
J. P. Crine, J. Jow, Conf. on Electr. Insul. and Dielectr. Phenom., 2000, p. 351.
G. Matey, F. Nicoulaz, J. C. Filippini, Y. Poggi, R. Bouzerara, 3rd Intern. Conf. on Conduct. and Breakd. in Sol. Dielectr., 1989, p. 500.
J. Y. Koo, J. C. Filippini, IEEE Trans. on Electr. Insul., 19, 217 (1984).
R. Patsch, M. Ortolf, J. Tanaka, 5th Intern. Conf. on Propert. and Appl. of Dielectr. Mater., 1997, p. 410.
H. M. Li, B. H. Crichton, R. A. Fouracre, M. J. Given, IEEE Trans. on Dielec. and Electr. Insul., 7, 432 (2000).
M. I. Qureshi, N. H. Malik, A. A. Al-Arainy, 6th Intern. Conf. on Propert. and Appl. of Dielectr. Mater., 2000, p. 513.
C. N. Saniyyati, Y. Z. Arief, M. H. Ahmad, M. A. M. Piah, Z. Adzis, A. A. Suleiman, N. A. Muhamad, IEEE 8th Intern. Pwr Eng. and Optim. Conf., Article No. 6814464, 2014, p. 413.
J. Y. Koo, J. T. Kim, B. W. Lee, B. H. Ryu, K. Y. Kim, J. C. Filippini, 4th Intern. Conf. on Conduct. and Breakd. in Sol. Dielectr., 1992, p. 440.
Y. Poggi, V. Raharimalala, J. C. Filippini, J. J. de Bellet, G. Matey, IEEE Trans. on Electr. Insul., 25, 1056 (1990).
Y. Poggi, J. C. Filippini, V. Raharimalala, 3rd Intern. Conf. on Conduct. and Breakd. in Sol. Dielectr., 1989, p. 517.
J. C. Filippini, IEEE Intern. Symp. on Electr. Insul., 1990, p. 183.
Y. Poggi, J. C. Filippini, V. Raharimalala, Polymer, 29, 376 (1988).
J. L. Parpal, C. Guddemi, N. Amyot, E. David, L. Lamarre, Conf. on Electr. Insul. and Dielectr. Phenom., 1994, p. 532.
P. F. Hinrichsen, A. Houdayer, A. Belhadfa, J. P. Crine, S. Pelissou, M. Cholewa, IEEE Trans. on Electr. Insul., 23, 971 (1988).
A. Bulinski, S. S. Bamji, J. M. Braun, J. Densley, Conf. on Electr. Insul. and Dielectr. Phenom., 1992, p. 610.