Dielectric Properties of La0.4Ca0.6Mn0.4Ti0.6O3 Ceramic Oxide
Keywords:Dielectric properties, Ceramic, Universal capacitor
AbstractThe dielectric properties of La0.4Ca0.6Mn0.4Ti0.6O3 ceramic oxide was investigated under various temperatures. A Debyelike
behaviour was observed although the dc conduction effects at low frequencies almost overlapping the relaxation
peak in the imaginary part. This feature of dielectric behaviour was explained using trapping mechanism. An equivalent
circuit modeling was proposed to represent the electrical behaviour of this sample using universal capacitor, C*(4) =
B(i4)n-1. The circuit modeling is consisting of two series of dispersive capacitors in parallel with conductance and high
M.A. Subramanian, D.Li, N. Duan, B.A. Reisner, and. A.W. Sleight, J. Solid State Chem, 151 (2000) 323-325.
P. Jha, P. Avora, and A.K. Ganguli, Materials letters, 57 (2003) 2443-2446.
D.C. Sinclair, T.B. Adams, F.D. Morrison, and A.R. West, Applied Phys. Lett., 80 (2002) 2153-2155.
T.F. Tsang, J.L. Wei, and Y.L. Chia, Physical Review B, 76 (2007) 045115.
P. Jha, S. Rai, K.V. Ramanujachary, S.E. Lovland, and A.K. Ganguli, J. Solid State Chem., 177 (2004) 2881-2888.
M. Li, A. Feteira, and D.C. Sinclair, J. Appl. Phys, 98 (2005) 084101-1-6.
A.K. Jonscher, Dielectric relaxation in solid, Chelsea dielectric press, London (1983).
T.Ramdeem, L.A. Dissado and R.M. Hill, J. Chem. Soc. Faraday Trans. 1. 80 (1984) 325-340.
L.A. Dissado, and R.M. Hill, J. Chem. Soc. Faraday Trans. 2. 80 (1984) 291-319.
R.M. Hill, and C. Pickup, J. materials science 20 (1985) 4431-4444.
A.K. Jonscher, C. Pickup, and S.H. Zaidi, J. semicond. Sci. Technol. 1 (1986) 71-92.